Developement of a TEM-based Orientation Microscopy System and its Application 
to Study of Microstructure and Texture of Nanocrystalline NiCo Samples

Wu, G.; Zaefferer, S.

Lokale TagsFreigabegeschichteDetailsÜbersicht

Developement of a TEM-based Orientation Microscopy System and its Application to Study of Microstructure and Texture of Nanocrystalline NiCo Samples

Wu, G., & Zaefferer, S. (2008). Developement of a TEM-based Orientation Microscopy System and its Application to Study of Microstructure and Texture of Nanocrystalline NiCo Samples. Talk presented at 15th International Conference on the Texture of Materials (ICOTOM 15). Pittsburgh, PA, USA. 2008-06-01 - 2008-06-06.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4919-0 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-491B-C

Genre: Vortrag

ausblenden:

Urheber:
Wu, G.¹, Autor
Zaefferer, S.¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391