Orientation microscopy in the TEM – techniques, possibilities and limits

Zaefferer, S.

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Orientation microscopy in the TEM – techniques, possibilities and limits

Zaefferer, S. (2008). Orientation microscopy in the TEM – techniques, possibilities and limits. Institute for Materials Science, Lehigh University. Bethlehem [USA], 2008-05-29.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4985-D Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4987-9

Genre: Lehrmaterial

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Urheber:
Zaefferer, S.¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391