SEM and TEM-based orientation microscopy and Monte-Carlo modelling: A toolbox 
to study recrystallisation nucleation processes

Zaefferer, S.

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SEM and TEM-based orientation microscopy and Monte-Carlo modelling: A toolbox to study recrystallisation nucleation processes

Zaefferer, S. (2008). SEM and TEM-based orientation microscopy and Monte-Carlo modelling: A toolbox to study recrystallisation nucleation processes. Talk presented at Annual Meeting of the Canadian Microscopical Society 2008. Montreal, Canada. 2008-05-22.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-49A9-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-49AB-8

Genre: Talk

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Creators:
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 378193

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Title: Annual Meeting of the Canadian Microscopical Society 2008

Place of Event: Montreal, Canada

Start-/End Date: 2008-05-22

Invited: Yes

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