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  The electron backscatter diffraction (EBSD) technique – Fundamentals and applications

Zaefferer, S. (2008). The electron backscatter diffraction (EBSD) technique – Fundamentals and applications. Workshop at the annual meeting of the Canadian Microscopical Society 2008. Montreal, Canada, 2008-05-20.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-49BD-F Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-49BF-B
Genre: Teaching

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 Creators:
Zaefferer, S.1, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 378204
 Degree: -

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Title: Workshop at the annual meeting of the Canadian Microscopical Society 2008
Place of Event: Montreal, Canada
Start-/End Date: 2008-05-20

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