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  Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: Robust detection of subtle differences in EBSD patterns

Zaefferer, S., Ishikawa, S., & Stein, F. (2008). Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: Robust detection of subtle differences in EBSD patterns. Poster presented at Electron Backscatter Diffraction Meeting, RMS Conference, Sheffield, UK.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-4AA1-3 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-11FA-7
Genre: Poster

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 Creators:
Zaefferer, Stefan1, Author              
Ishikawa, Shigehiro2, Author              
Stein, Frank2, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863368              

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Language(s): eng - English
 Dates: 2008-04
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 345182
 Degree: -

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Title: Electron Backscatter Diffraction Meeting, RMS Conference
Place of Event: Sheffield, UK
Start-/End Date: 2008-03-31 - 2008-04-01

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