Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: 
Robust detection of subtle differences in EBSD patterns

Zaefferer, Stefan; Ishikawa, Shigehiro; Stein, Frank

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Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: Robust detection of subtle differences in EBSD patterns

Zaefferer, S., Ishikawa, S., & Stein, F. (2008). Distinction of different Laves phase types by EBSD in a TiCr diffusion couple: Robust detection of subtle differences in EBSD patterns. Poster presented at Electron Backscatter Diffraction Meeting, RMS Conference, Sheffield, UK.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4AA1-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-11FA-7

Genre: Poster

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Creators:
Zaefferer, Stefan¹, Author
Ishikawa, Shigehiro², Author
Stein, Frank², Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863368

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Language(s): eng - English

Dates: Created: 2008-04

Publication Status: Not specified

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Identifiers: eDoc: 345182

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Title: Electron Backscatter Diffraction Meeting, RMS Conference

Place of Event: Sheffield, UK

Start-/End Date: 2008-03-31 - 2008-04-01

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