English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  3D orientation microscopy by combined FIB-serial sectioning EBSD-based orientation microscopy: Principles and applications

Zaefferer, S. (2007). 3D orientation microscopy by combined FIB-serial sectioning EBSD-based orientation microscopy: Principles and applications. Talk presented at FEMMS 2007. Sonoma, USA. 2007-09-25.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Zaefferer, S.1, Author           
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

Content

show

Details

show
hide
Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 379769
 Degree: -

Event

show
hide
Title: FEMMS 2007
Place of Event: Sonoma, USA
Start-/End Date: 2007-09-25
Invited: Yes

Legal Case

show

Project information

show

Source

show