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  Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques

Kelm, K., Irsen, S. H., Quandt, E., Paninski, M., Drevermann, A., Schmitz, G. J., et al. (2007). Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques. Talk presented at 33rd Conference of the DGE Deutsche Gesellschaft für Elektronenmikroskopie e.V. Saarbrücken, Germany. 2007-09-02 - 2007-09-07.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5177-8 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0023-F29A-8
Genre: Talk

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 Creators:
Kelm, Klemens1, Author              
Irsen, Stephan H.2, Author              
Quandt, Eckhard3, Author              
Paninski, M.4, Author              
Drevermann, Anne5, Author              
Schmitz, Georg J.5, Author              
Palm, Martin6, Author              
Stein, Frank6, Author              
Heilmaier, Martin7, Author              
Engberding, Nico6, Author              
Saage, Holger7, Author              
Sturm, Daniel8, Author              
Affiliations:
1Stiftung caesar, Electron Microscopy, Bonn, Germany, ou_persistent22              
2Research Center Caesar, Ludwig-Erhard-Allee 2, D-53175 Bonn, Germany, ou_persistent22              
3Center of Advanced European Studies and Research (caesar), Ludwig-Erhard-Allee 2, 53175 Bonn, Germany, ou_persistent22              
4ACCESS e.V., Intzestraße 5, D-52072 Aachen, Germany, ou_persistent22              
5ACCESS e.V., D-52072 Aachen, Germany, ou_persistent22              
6Development and Characterisation of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863368              
7Otto-von-Guericke-Universität Magdeburg, Institut für Werkstoff- und Fügetechnik, Lehrstuhl Werkstoffprüftechnik, Grobe Steinernetischstrabe 6, Magdeburg, Germany, ou_persistent22              
8Otto-von-Guericke University Magdeburg, Institute for Materials Joining and Technology, D-39104 Magdeburg, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2007-09
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 343267
 Degree: -

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Title: 33rd Conference of the DGE Deutsche Gesellschaft für Elektronenmikroskopie e.V.
Place of Event: Saarbrücken, Germany
Start-/End Date: 2007-09-02 - 2007-09-07

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