3D-orientation microscopy in a FIB SEM: A new dimension of microstructure 
characterisation

Zaefferer, S.; Wright, S. I.; Raabe, D.

Local TagsRelease HistoryDetailsSummary

3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation

Zaefferer, S., Wright, S. I., & Raabe, D. (2007). 3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation. Talk presented at M&M 2007, Microscopy and Microanalysis 2007 Meeting. Ft. Lauderdale, FL, USA. 2007-08-07.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-51A3-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-51A5-F

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Zaefferer, S.¹, Author
Wright, S. I., Author
Raabe, D.², Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 379768

Degree: -

Event

show

hide

Title: M&M 2007, Microscopy and Microanalysis 2007 Meeting

Place of Event: Ft. Lauderdale, FL, USA

Start-/End Date: 2007-08-07

Invited: Yes

Legal Case

show

Project information

show

Source

show