3D orientation microscopy in a FIB-SEM: A new dimension of microstructure 
characterisation

Zaefferer, S.

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3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation

Zaefferer, S. (2007). 3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation. Talk presented at 10th SFµ Annual Colloquium. Grenoble, France. 2007-06-07.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-525E-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3E7D-5

Genre: Talk

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Creators:
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2007-06

Publication Status: Not specified

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Identifiers: eDoc: 379767

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Title: 10th SFµ Annual Colloquium

Place of Event: Grenoble, France

Start-/End Date: 2007-06-07

Invited: Yes

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