Impedance spectroscopy on thin (d ≈ 4 nm) tantalum oxide films

Bruder, K.; Hassel, A. W.; Mildner, B.; Diesing, D.

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Impedance spectroscopy on thin (d ≈ 4 nm) tantalum oxide films

Bruder, K., Hassel, A. W., Mildner, B., & Diesing, D. (2007). Impedance spectroscopy on thin (d ≈ 4 nm) tantalum oxide films. Talk presented at EIS 2007, 7th International Symposium on Electrochemical Impedance Spectroscopy. Argelès-sur-Mer, France. 2007-06-03 - 2007-06-08.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-527A-9 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-C4D8-D

Genre: Talk

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Creators:
Bruder, K.¹, Author
Hassel, A. W.¹, Author
Mildner, B., Author
Diesing, D., Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355

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Language(s): eng - English

Dates: Created: 2007-06

Publication Status: Not specified

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Identifiers: eDoc: 319248

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Title: EIS 2007, 7th International Symposium on Electrochemical Impedance Spectroscopy

Place of Event: Argelès-sur-Mer, France

Start-/End Date: 2007-06-03 - 2007-06-08

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