English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Rohwerder, M., & Turcu, E. F. (2007). High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP). Electrochimica Acta, 53(2), 290-299. doi:10.1016/j.electacta.2007.03.016.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-54F0-4 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-6A17-4
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Rohwerder, Michael1, Author              
Turcu, Eugen Florin1, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2007-12-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 321125
DOI: 10.1016/j.electacta.2007.03.016
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Electrochimica Acta
  Abbreviation : Electrochim. Acta
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Oxford, UK : Pergamon-Elsevier Science Ltd
Pages: - Volume / Issue: 53 (2) Sequence Number: - Start / End Page: 290 - 299 Identifier: ISSN: 0013-4686
CoNE: https://pure.mpg.de/cone/journals/resource/954925396434