Stress, strain, and electric field calculation for dislocations and their 
contrast under two-beam conditions: Implementation in Matlab

Eibl, O.; Peranio, N.

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Stress, strain, and electric field calculation for dislocations and their contrast under two-beam conditions: Implementation in Matlab

Eibl, O., & Peranio, N. (2007). Stress, strain, and electric field calculation for dislocations and their contrast under two-beam conditions: Implementation in Matlab. Microscopy and Microanalysis, 13(3), 353-353.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-550C-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-550E-9

Genre: Conference Paper

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Creators:
Eibl, O., Author
Peranio, N.¹, Author

Affiliations:
1Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392

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Language(s): eng - English

Dates: Date issued: 2007

Publication Status: Issued

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Identifiers: eDoc: 321580

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Title: Deutsche Gesellschaft für Elektronenmikroskopie: Microscopy conference 2007

Place of Event: Saarbrücken, Germany

Start-/End Date: 2007-09-02 - 2007-09-07

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Title: Microscopy and Microanalysis

Alternative Title : Microsc. Microanal.

Source Genre: Journal

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Pages: - Volume / Issue: 13 (3) Sequence Number: - Start / End Page: 353 - 353 Identifier: ISSN: 1431-9276