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  Advanced electron microscopy of SiC added MgB2 wires and tapes

Birajdar, B., Peranio, N., & Eibl, O. (2007). Advanced electron microscopy of SiC added MgB2 wires and tapes. Microscopy and Microanalysis, 13: 3, 286-287.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5518-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-551A-D
Genre: Conference Paper

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 Creators:
Birajdar, B., Author
Peranio, N.1, Author              
Eibl, O., Author
Affiliations:
1Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392              

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Language(s): eng - English
 Dates: 2007
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 321588
 Degree: -

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Title: Deutsche Gesellschaft für Elektronenmikroskopie: Microscopy conference 2007
Place of Event: Saarbrücken, Germany
Start-/End Date: 2007

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Title: Microscopy and Microanalysis
  Alternative Title : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
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Publ. Info: -
Pages: - Volume / Issue: 13 Sequence Number: 3 Start / End Page: 286 - 287 Identifier: ISSN: 1431-9276