Advanced electron microscopy of SiC added MgB2 wires and tapes

Birajdar, B.; Peranio, N.; Eibl, O.

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Advanced electron microscopy of SiC added MgB₂ wires and tapes

Birajdar, B., Peranio, N., & Eibl, O. (2007). Advanced electron microscopy of SiC added MgB₂ wires and tapes. Microscopy and Microanalysis, 13: 3, 286-287.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5518-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-551A-D

Genre: Conference Paper

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Creators:
Birajdar, B., Author
Peranio, N.¹, Author
Eibl, O., Author

Affiliations:
1Theory and Simulation, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863392

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Language(s): eng - English

Dates: Date issued: 2007

Publication Status: Issued

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Identifiers: eDoc: 321588

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Title: Deutsche Gesellschaft für Elektronenmikroskopie: Microscopy conference 2007

Place of Event: Saarbrücken, Germany

Start-/End Date: 2007

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Title: Microscopy and Microanalysis

Alternative Title : Microsc. Microanal.

Source Genre: Journal

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Pages: - Volume / Issue: 13 Sequence Number: 3 Start / End Page: 286 - 287 Identifier: ISSN: 1431-9276