Bastos, A., Zaefferer, S., & Raabe, D. (2006). 3D EBSD Characterization of a Nanocrystalline NiCo Alloy by use of a High-resolution Field Emission SEM-EBSD Coupled with Serial Sectioning in a Focused Ion Beam Microscope (FIB). Talk presented at MRS Fall Conference. Boston, MA, USA. 2006-11-29.