Microstructure and Residual Stress Formation in Oxide Layers Grown in High 
Niobium Containing g-TiAl Based Alloy

Silva, P.; Pinto, H.; Kostka, A.; Chladil, H. F.; Pyzalla, A.

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Microstructure and Residual Stress Formation in Oxide Layers Grown in High Niobium Containing g-TiAl Based Alloy

Silva, P., Pinto, H., Kostka, A., Chladil, H. F., & Pyzalla, A. (2006). Microstructure and Residual Stress Formation in Oxide Layers Grown in High Niobium Containing g-TiAl Based Alloy. Poster presented at SNI 2006, German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities, Hamburg, Germany.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-573C-4 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0002-91B4-E

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Urheber:
Silva, P.¹, Autor
Pinto, H.², Autor
Kostka, A.³, Autor
Chladil, H. F., Autor
Pyzalla, A.⁴, Autor

Affiliations:
1Metallurgy, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863364
2Materials Testing, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863363
3Microstructure Characterization, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863365
4Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863361