Investigations on the kinetics of single grains and grain boundaries by use of 
Scan-ning Electrochemical Microscopy (SECM)

Lill, K. A.; Fushimi, K.; Hassel, A. W.; Seo, M.

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Investigations on the kinetics of single grains and grain boundaries by use of Scan-ning Electrochemical Microscopy (SECM)

Lill, K. A., Fushimi, K., Hassel, A. W., & Seo, M. (2006). Investigations on the kinetics of single grains and grain boundaries by use of Scan-ning Electrochemical Microscopy (SECM). Poster presented at 6th International Symposium on Electrochemical Micro & Nanosystem Technologies, Bonn, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5852-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-8ECB-A

Genre: Poster

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Creators:
Lill, K. A.¹, Author
Fushimi, K.², Author
Hassel, A. W.¹, Author
Seo, M., Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355
2External Organizations, ou_persistent22

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Language(s): eng - English

Dates: Created: 2006-08

Publication Status: Not specified

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Identifiers: eDoc: 289050

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Title: 6th International Symposium on Electrochemical Micro & Nanosystem Technologies

Place of Event: Bonn, Germany

Start-/End Date: 2006-08-22 - 2006-08-25

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