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  3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation

Zaefferer, S., Konrad, J., & Raabe, D. (2005). 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Talk presented at Microscopy Conference 2005. Davos, Switzerland. 2005-08-08 - 2005-09-02.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5ED1-3 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5ED3-0
Genre: Talk

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 Creators:
Zaefferer, S.1, Author              
Konrad, J.1, 2, Author              
Raabe, D.3, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Development and Characterization of New Materials, Materials Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 292284
 Degree: -

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Title: Microscopy Conference 2005
Place of Event: Davos, Switzerland
Start-/End Date: 2005-08-08 - 2005-09-02

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