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  Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes

Zaefferer, S. (2005). Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. Talk presented at 14th International Conference on Textures of Materials (ICOTOM 14). Leuven, Belgium. 2005-07-11 - 2005-07-15.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5F05-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5F07-3
Genre: Talk

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 Creators:
Zaefferer, S.1, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Identifiers: eDoc: 292285
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Title: 14th International Conference on Textures of Materials (ICOTOM 14)
Place of Event: Leuven, Belgium
Start-/End Date: 2005-07-11 - 2005-07-15

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