Application of orientation microscopy in SEM and TEM for the study of texture 
formation during recrystallisation processes

Zaefferer, S.

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Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes

Zaefferer, S. (2005). Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. Talk presented at 14th International Conference on Textures of Materials (ICOTOM 14). Leuven, Belgium. 2005-07-11 - 2005-07-15.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5F05-7 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-5F07-3

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Urheber:
Zaefferer, S.¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391