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  Characterization of Nanostructured Electrodeposited NiCo Samples by use of Electron Backscatter Diffraction (EBSD)

Bastos, A., Zaefferer, S., & Raabe, D. (2005). Characterization of Nanostructured Electrodeposited NiCo Samples by use of Electron Backscatter Diffraction (EBSD). Talk presented at Conference on Textures of Materials ICOTOM 14. Leuven, Belgium. 2005-07.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5F37-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-5F39-6
Genre: Talk

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 Creators:
Bastos, A., Author
Zaefferer, S.1, Author              
Raabe, D.2, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Method: -
 Identifiers: eDoc: 287847
 Degree: -

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Title: Conference on Textures of Materials ICOTOM 14
Place of Event: Leuven, Belgium
Start-/End Date: 2005-07

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