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  Structural analysis of Bi2Te3 superlattices epitaxially grown on BaF2 by transmission electron microscopy

Peranio, N., Eibl, O., & Nurnus, J. (2005). Structural analysis of Bi2Te3 superlattices epitaxially grown on BaF2 by transmission electron microscopy. In ICT2004. Piscataway, NJ, USA: IEEE.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-62EB-1 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-62ED-E
Genre: Conference Paper

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 Creators:
Peranio, N.1, Author              
Eibl, O., Author
Nurnus, J., Author
Affiliations:
1External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2005
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 321578
 Degree: -

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Title: 23th International Conference on Thermoelectrics (ICT2004)
Place of Event: Adelaide, Australia
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Title: ICT2004
Source Genre: Proceedings
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Publ. Info: Piscataway, NJ, USA : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: ISBN: 1424401283