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  Quantitative EDX analysis of Bi2Te3 in the TEM

Peranio, N., & Eibl, O. (2005). Quantitative EDX analysis of Bi2Te3 in the TEM.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-62EF-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-62F1-2
Genre: Conference Paper

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 Creators:
Peranio, N.1, Author           
Eibl, O., Author
Affiliations:
1External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2005
 Publication Status: Issued
 Pages: 79
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 321589
 Degree: -

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Title: Microscopy conference 2005
Place of Event: Davos, Switzerland
Start-/End Date: 2005

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