English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments

Grundmeier, G., Wapner, K., Schönberger, B., & Stratmann, M. (2004). Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments. Talk presented at ISE Conference, 55th Annual Meeting. Thessaloniki, Greece. 2004-09-19 - 2004-09-24.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-640F-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-6411-8
Genre: Talk

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Grundmeier, G.1, 2, Author              
Wapner, K.1, Author              
Schönberger, B.3, Author              
Stratmann, M.3, Author              
Affiliations:
1Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863349              
2Christian Doppler Laboratory for Metal/Polymer Interfaces, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863353              
3Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

Content

show

Details

show
hide
Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 288666
 Degree: -

Event

show
hide
Title: ISE Conference, 55th Annual Meeting
Place of Event: Thessaloniki, Greece
Start-/End Date: 2004-09-19 - 2004-09-24

Legal Case

show

Project information

show

Source

show