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  Scanning Kelvin Probe Force Microscopy (SKPFM) – Nanoskopische Aspekte der Korrosion

Rohwerder, M. (2004). Scanning Kelvin Probe Force Microscopy (SKPFM) – Nanoskopische Aspekte der Korrosion. Talk presented at 4. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Westfälische Wilhelms-Universität in Münster. Münster, Germany. 2004-02-20 - 2004-02-21.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-6608-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0025-74AD-7
Genre: Talk

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 Creators:
Rohwerder, Michael1, Author              
Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360              

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Language(s): deu - German
 Dates: 2004-02
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 124366
 Degree: -

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Title: 4. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Westfälische Wilhelms-Universität in Münster
Place of Event: Münster, Germany
Start-/End Date: 2004-02-20 - 2004-02-21

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