Scanning Kelvin Probe Force Microscopy (SKPFM) – Nanoskopische Aspekte der 
Korrosion

Rohwerder, Michael

Local TagsRelease HistoryDetailsSummary

Scanning Kelvin Probe Force Microscopy (SKPFM) – Nanoskopische Aspekte der Korrosion

Rohwerder, M. (2004). Scanning Kelvin Probe Force Microscopy (SKPFM) – Nanoskopische Aspekte der Korrosion. Talk presented at 4. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Westfälische Wilhelms-Universität in Münster. Münster, Germany. 2004-02-20 - 2004-02-21.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6608-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-74AD-7

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Rohwerder, Michael¹, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360

Content

show

Details

show

hide

Language(s): deu - German

Dates: Created: 2004-02

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 124366

Degree: -

Event

show

hide

Title: 4. Workshop Rasterkraftmikroskopie in der Werkstoffwissenschaft, Westfälische Wilhelms-Universität in Münster

Place of Event: Münster, Germany

Start-/End Date: 2004-02-20 - 2004-02-21

Legal Case

show

Project information

show

Source

show