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  The mapping of texture functions on finite element grids for anisotropy simulations

Raabe, D. (2004). The mapping of texture functions on finite element grids for anisotropy simulations. Düsseldorf, Germany: MPI für Eisenforschung GmbH.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-6705-E Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-6707-A
Genre: Other

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texture_FEM-integration_Raabe_report.pdf (Any fulltext), 530KB
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 Creators:
Raabe, D.1, Author              
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1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              

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Free keywords: orientation distribution function, simulation, crystallographic texture, crystal plasticity, anisotropy, finite elements
 Abstract: The study discusses how crystal orientation distributions can be mapped on finite element grids for conducting large scale anisotropy simulations which use anisotropic crystalline constitutive laws. Methods based on direct pole figure inversion, series expansions of spherical harmonics, or a large sets of discrete orientation values are not appropriate to reproduce crystallographic textures in a sufficiently localized spherical form onto finite element grids. The texture component method which employs Lorentz or Gauss shaped spherical functions is better suited for this task. It offers a good compromise between discreteness (spherical localization), exactness (approximation of complicated orientation distribution functions can be achieved by a few texture components), compactness (simple functions), scalability (the number of used texture components can be systematically varied according to the desired precision of the texture fit), and physical significance (texture components are related to microstructural mechanisms).

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Language(s): eng - English
 Dates: 2004
 Publication Status: Published in print
 Pages: -
 Publishing info: Düsseldorf, Germany : MPI für Eisenforschung GmbH
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 64952
 Degree: -

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