Quantification and modification of trap distributions in anodic aluminium oxide 
films

Hassel, A. W.; Diesing, D.

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Quantification and modification of trap distributions in anodic aluminium oxide films

Hassel, A. W., & Diesing, D. (2002). Quantification and modification of trap distributions in anodic aluminium oxide films. Poster presented at 53rd Meeting of the International Society of Electrochemistry, Düsseldorf, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6DE2-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-8409-F

Genre: Poster

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Creators:
Hassel, A. W.¹, Author
Diesing, D., Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355

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Language(s): eng - English

Dates: Created: 2002-09

Publication Status: Not specified

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Identifiers: eDoc: 230032

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Title: 53rd Meeting of the International Society of Electrochemistry

Place of Event: Düsseldorf, Germany

Start-/End Date: 2002-09-15 - 2002-09-20

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