Transient states in the breakdown of thin oxide films

Diesing, D.; Hassel, A. W.

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Transient states in the breakdown of thin oxide films

Diesing, D., & Hassel, A. W. (2002). Transient states in the breakdown of thin oxide films. Talk presented at Jahrestagung der Deutschen Physikalischen Gesellschaft. Regensburg, Germany. 2002-03-11 - 2002-03-15.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6EA2-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6EA4-A

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Creators:
Diesing, D., Author
Hassel, A. W.¹, Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355

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Identifiers: eDoc: 230073

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Title: Jahrestagung der Deutschen Physikalischen Gesellschaft

Place of Event: Regensburg, Germany

Start-/End Date: 2002-03-11 - 2002-03-15

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