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  Breakdown of ultrathin anodic valve metal oxide films in metal-insulator-metal-contacts compared with metal-insulator-electrolyte contacts

Hassel, A. W., & Diesing, D. (2002). Breakdown of ultrathin anodic valve metal oxide films in metal-insulator-metal-contacts compared with metal-insulator-electrolyte contacts. Thin Solid Films, 414, 296-303.

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 Creators:
Hassel, A. W.1, Author              
Diesing, D., Author
Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355              

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Language(s): eng - English
 Dates: 2002
 Publication Status: Published in print
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 12917
 Degree: -

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Title: Thin Solid Films
Source Genre: Journal
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Pages: - Volume / Issue: 414 Sequence Number: - Start / End Page: 296 - 303 Identifier: -