Breakdown of ultrathin anodic valve metal oxide films in 
metal-insulator-metal-contacts compared with metal-insulator-electrolyte 
contacts

Hassel, A. W.; Diesing, D.

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Breakdown of ultrathin anodic valve metal oxide films in metal-insulator-metal-contacts compared with metal-insulator-electrolyte contacts

Hassel, A. W., & Diesing, D. (2002). Breakdown of ultrathin anodic valve metal oxide films in metal-insulator-metal-contacts compared with metal-insulator-electrolyte contacts. Thin Solid Films, 414, 296-303.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6F03-E Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6F05-A

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Urheber:
Hassel, A. W.¹, Autor
Diesing, D., Autor

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355