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  Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment

Hassel, A. W., & Diesing, D. (2002). Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment. Electrochemistry Communications, 4, 1-4.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-6F07-6 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-6F09-2
Genre: Journal Article

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 Creators:
Hassel, A. W.1, Author              
Diesing, D., Author
Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355              

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Language(s): eng - English
 Dates: 2002
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 12919
 Degree: -

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Title: Electrochemistry Communications
  Alternative Title : Electrochem. Commun.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 4 Sequence Number: - Start / End Page: 1 - 4 Identifier: -