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  Chemical structure and morphology of thin, organo-silicon plasma-polymer films as a function of process parameters

Shirtcliffe, N., Thiemann, P., Stratmann, M., & Grundmeier, G. (2001). Chemical structure and morphology of thin, organo-silicon plasma-polymer films as a function of process parameters. Surface & Coatings Technology, 142-144, 1121-1128.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-70C0-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0019-70C2-C
Genre: Journal Article

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 Creators:
Shirtcliffe, N.1, Author              
Thiemann, P.1, Author              
Stratmann, M.2, Author              
Grundmeier, G.1, Author              
Affiliations:
1Adhesion and Thin Films, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863349              
2Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863348              

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 Dates: 2001-07
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 225229
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Title: Surface & Coatings Technology
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 142-144 Sequence Number: - Start / End Page: 1121 - 1128 Identifier: -