Scanning Kelvin Probe and Scanning Kelvin Probe Force Microscopy and their 
Application in Corrosion Science

Rohwerder, Michael

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Scanning Kelvin Probe and Scanning Kelvin Probe Force Microscopy and their Application in Corrosion Science

Rohwerder, M. (2008). Scanning Kelvin Probe and Scanning Kelvin Probe Force Microscopy and their Application in Corrosion Science. In U. K. Mudali, & B. Raj (Eds.), Corrosion Science and Technology: Mechanism, Mitigation and Monitoring (pp. 468-499). London, UK: Taylor & Francis.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-7286-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0025-6CFE-E

Genre: Book Chapter

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Creators:
Rohwerder, Michael¹, Author

Affiliations:
1Molecular Structure and Surface Modification, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863360

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Dates: Date issued: 2008-11-30

Publication Status: Issued

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Identifiers: eDoc: 225195

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Title: Corrosion Science and Technology: Mechanism, Mitigation and Monitoring

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Source Genre: Book

Creator(s):
Mudali, U. Kamachi, Editor
Raj, Baldev, Editor

Affiliations:
-

Publ. Info: London, UK : Taylor & Francis

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 468 - 499 Identifier: ISBN: 0849333741
ISBN: 978-0849333743