Processes in Thin Aluminium Oxide Films Monitored by High Resolution Current 
Transients

Hassel, A. W.

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Processes in Thin Aluminium Oxide Films Monitored by High Resolution Current Transients

Hassel, A. W. (1998). Processes in Thin Aluminium Oxide Films Monitored by High Resolution Current Transients. Talk presented at 1998 Joint Meeting of the Electrochemical Society of Japan, The Surface Finishing Society of Japan and the Japan Society of Corrosion Engineering. Sapporo, Japan. 1998-01-16 - 1998-01-16.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-7301-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-7303-F

Genre: Talk

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Creators:
Hassel, A. W.¹, Author

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1External Organizations, ou_persistent22

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Identifiers: eDoc: 230047

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Title: 1998 Joint Meeting of the Electrochemical Society of Japan, The Surface Finishing Society of Japan and the Japan Society of Corrosion Engineering

Place of Event: Sapporo, Japan

Start-/End Date: 1998-01-16 - 1998-01-16

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