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  Spectroscopy of Stripe Order in La1.8Sr0.2NiO4 Using Resonant Soft X-Ray Diffraction

Schüßler-Langeheine, C., Schlappa, J., Tanaka, A., Hu, Z., Chang, C. F., Schierle, E., et al. (2005). Spectroscopy of Stripe Order in La1.8Sr0.2NiO4 Using Resonant Soft X-Ray Diffraction. Physical Review Letters, 95(15): 156402, pp. 1-4. doi:10.1103/PhysRevLett.95.156402.

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Schüßler-Langeheine, C.1, Author
Schlappa, J.1, Author
Tanaka, A.1, Author
Hu, Z.1, Author
Chang, C. F.1, Author
Schierle, E.1, Author
Benomar, M.1, Author
Ott, H.1, Author
Weschke, E.1, Author
Kaindl, G.1, Author
Friedt, O.1, Author
Sawatzky, G. A.1, Author
Lin, H.-J.1, Author
Chen, C. T.1, Author
Braden, M.1, Author
Tjeng, L. H.2, Author           
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1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: Strong resonant enhancements of the charge-order and spin-order superstructure-diffraction intensities in La1.8Sr0.2NiO4 are observed when x-ray energies in the vicinity of the Ni L-2,L-3 absorption edges are used. The pronounced photon-energy and polarization dependences of these diffraction intensities allow for a critical determination of the local symmetry of the ordered spin and charge carriers. We found that not only the antiferromagnetic order but also the charge-order superstructure resides within the NiO2 layers; the holes are mainly located on in-plane oxygens surrounding a Ni2+ site with the spins coupled antiparallel in close analogy to Zhang-Rice singlets in the cuprates.

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 Dates: 2005-10-06
 Publication Status: Issued
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Title: Physical Review Letters
  Other : Phys. Rev. Lett.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Physical Society
Pages: - Volume / Issue: 95 (15) Sequence Number: 156402 Start / End Page: 1 - 4 Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406_1