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  Soft-X-ray magnetic circular dichroism: a new technique for probing magnetic properties of magnetic surfaces and ultrathin films

Tjeng, L. H., Idzerda, Y. U., Rudolf, P., Sette, F., & Chen, C. T. (1992). Soft-X-ray magnetic circular dichroism: a new technique for probing magnetic properties of magnetic surfaces and ultrathin films. Journal of Magnetism and Magnetic Materials, 109(2-3), 288-292. doi:10.1016/0304-8853(92)91762-I.

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 Creators:
Tjeng, L. H.1, Author              
Idzerda, Y. U.2, Author
Rudolf, P.2, Author
Sette, F.2, Author
Chen, C. T.2, Author
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1External Organizations, ou_persistent22              
2external, ou_persistent22              

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 Abstract: We demonstrate the feasibility of applying the novel soft-X-ray magnetic circular dichroism (SXMCD) technique to investigate the magnetic properties of magnetic surfaces and ultrathin films. Measurements have been carried out on Ni films ot various thickness on a Cu(100) substrate at the Ni L2.3 absorption edges. The SXMCD data exhibit strong temperature and thickness dependence, giving film thickness dependent Curie temperatures and suggesting that a single monolayer of Ni on a Cu(100) substrate may be non-magnetic.

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 Dates: 1992-03-01
 Publication Status: Published in print
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Title: Journal of Magnetism and Magnetic Materials
Source Genre: Journal
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Publ. Info: Amsterdam : North-Holland
Pages: - Volume / Issue: 109 (2-3) Sequence Number: - Start / End Page: 288 - 292 Identifier: ISSN: 0304-8853
CoNE: https://pure.mpg.de/cone/journals/resource/954925512464