English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Hillock Formation and Thermal Stresses in Thin Au Films on Si Substrates

Sauter, L. X., Balk, T. J., Dehm, G., Nucci, J., & Arzt, E. (2005). Hillock Formation and Thermal Stresses in Thin Au Films on Si Substrates. Materials Research Society Symposium Proceedings, 875: O5.2, pp. 177-182.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Sauter, Linda Xenia1, Author              
Balk, Thomas John2, Author              
Dehm, Gerhard3, Author              
Nucci, Julie1, Author              
Arzt, Eduard1, Author              
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2University of Kentucky, Department of Chemical and Materials Engineering, Lexington, USA, ou_persistent22              
3Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2005
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: 2005 Materials Research Society Spring Meeting; San Francisco, CA; United States; 28 March 2005 through 1 April 2005; Code 66359
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Materials Research Society Symposium Proceedings
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York : North Holland
Pages: - Volume / Issue: 875 Sequence Number: O5.2 Start / End Page: 177 - 182 Identifier: ISSN: 0272-9172
CoNE: https://pure.mpg.de/cone/journals/resource/110978978378769