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  Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Eiper, E., Martinschitz, K. J., Dehm, G., & Kečkéš, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster presented at Gordon Research Conference on thin film & smallscale mechanical behavior, Colby College Waterville, Maine, USA.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-4E11-D Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-4E12-B
Genre: Poster

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 Creators:
Eiper, Ernst1, Author              
Martinschitz, Klaus J.2, Author              
Dehm, Gerhard1, 3, Author              
Kečkéš, Jozef4, Author              
Affiliations:
1Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22              
2Department of Materials Physics, University of Leoben, Austrian Academy of Sciences, Austria, ou_persistent22              
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
4Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2006
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: Gordon Research Conference on thin film & smallscale mechanical behavior
Place of Event: Colby College Waterville, Maine, USA
Start-/End Date: 2006-07-30 - 2006-08-04

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