Size effect in metallic thin films characterized by low-temperature X-ray 
diffraction

Eiper, Ernst; Martinschitz, Klaus J.; Dehm, Gerhard; Kečkéš, Jozef

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Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Eiper, E., Martinschitz, K. J., Dehm, G., & Kečkéš, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster presented at Gordon Research Conference on thin film & smallscale mechanical behavior, Colby College Waterville, Maine, USA.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-4E11-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-4E12-B

Genre: Poster

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Creators:
Eiper, Ernst¹, Author
Martinschitz, Klaus J.², Author
Dehm, Gerhard^{1, 3}, Author
Kečkéš, Jozef⁴, Author

Affiliations:
1Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22
2Department of Materials Physics, University of Leoben, Austrian Academy of Sciences, Austria, ou_persistent22
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
4Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22

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Language(s): eng - English

Dates: Created: 2006

Publication Status: Not specified

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Title: Gordon Research Conference on thin film & smallscale mechanical behavior

Place of Event: Colby College Waterville, Maine, USA

Start-/End Date: 2006-07-30 - 2006-08-04

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