English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Eiper, E., Martinschitz, K. J., Dehm, G., & Kečkéš, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster presented at 55th Annual Denver X-ray Conference, Denver, CO, USA.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-4E1A-C Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-4E1B-A
Genre: Poster

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Eiper, Ernst1, Author              
Martinschitz, Klaus J.2, Author              
Dehm, Gerhard1, 3, Author              
Kečkéš, Jozef4, Author              
Affiliations:
1Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22              
2Erich Schmid Institute for Materials Science, Austrian Academy of Sciences, Austria, ou_persistent22              
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
4Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2006
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: 55th Annual Denver X-ray Conference
Place of Event: Denver, CO, USA
Start-/End Date: 2006-08-07 - 2006-08-11

Legal Case

show

Project information

show

Source

show