Size effect in metallic thin films characterized by low-temperature X-ray 
diffraction

Eiper, Ernst; Martinschitz, Klaus J.; Dehm, Gerhard; Kečkéš, Jozef

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Size effect in metallic thin films characterized by low-temperature X-ray diffraction

Eiper, E., Martinschitz, K. J., Dehm, G., & Kečkéš, J. (2006). Size effect in metallic thin films characterized by low-temperature X-ray diffraction. Poster presented at 55th Annual Denver X-ray Conference, Denver, CO, USA.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-4E1A-C Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-4E1B-A

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Urheber:
Eiper, Ernst¹, Autor
Martinschitz, Klaus J.², Autor
Dehm, Gerhard^{1, 3}, Autor
Kečkéš, Jozef⁴, Autor

Affiliations:
1Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22
2Erich Schmid Institute for Materials Science, Austrian Academy of Sciences, Austria, ou_persistent22
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
4Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22