Deutsch
 
Hilfe Datenschutzhinweis Impressum
  DetailsucheBrowse

Datensatz

DATENSATZ AKTIONENEXPORT
 
 
DownloadE-Mail
 Lokale TagsFreigabegeschichteDetailsÜbersicht
  Experimental studies on epitaxially grown TiN and VN films

Kutschej, K., Rashkova, B., Shen, J., Edwards, D., Mitterer, C., & Dehm, G. (2007). Experimental studies on epitaxially grown TiN and VN films. Thin Solid Films, 516(2-4), 369-373. doi:10.1016/j.tsf.2007.06.104.

Item is

 

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:
Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-5189-E Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-518A-C
Genre: Zeitschriftenartikel

Externe Referenzen

einblenden:

Urheber

einblenden:
ausblenden:
 Urheber:
Kutschej, Kerstin1, Autor           
Rashkova, Boryana2, Autor           
Shen, J.1, Autor           
Edwards, Darren3, Autor           
Mitterer, Christian4, Autor           
Dehm, Gerhard5, Autor           
Affiliations:
1Department of Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria, ou_persistent22              
2Department Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Strasse 18, 8700 Leoben, Austria, ou_persistent22              
3Department of Materials Physics, University of Leoben, Erich Schmid Institute for Materials Science, Jahnstr. 12, A-8700 Leoben, Austria, ou_persistent22              
4Department of Physical Metallurgy and Materials Testing, Christian-Doppler Laboratory for Advanced Coatings, University of Leoben, Austria, ou_persistent22              
5Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

Inhalt

einblenden:
ausblenden:
Schlagwörter: -
 Zusammenfassung: TiN and VN single-layers were grown on (100) and (111)MgO substrates as model systems for future studies of V diffusion and understanding the evolution of the lubricous V2O5 phase on coating surfaces. The present study aims at elucidating the epitaxial quality and microstructure of TiN and VN films grown by unbalanced d.c. magnetron sputtering fromTi andV targets in Ar+N2 on (100) and (111)MgO substrates.X-ray diffraction and electron back-scatter diffraction give evidence for epitaxial growth of the films on both MgO substrate orientations. Transmission electron microscopy studies reveal a cube-on-cube orientation for all film/substrate combinations. The higher dislocation density and larger fraction of misoriented grains for VN films onMgOis explained by the higher growth rate and lattice mismatch compared to TiN. Nanoindentationmeasurements of the (100) oriented singlecrystal films reveal hardness values of ∼35 GPa for TiN and ∼23 GPa for VN.

Details

einblenden:
ausblenden:
Sprache(n): eng - English
 Datum: 2007-09-232007-12
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: DOI: 10.1016/j.tsf.2007.06.104
 Art des Abschluß: -

Veranstaltung

einblenden:

Entscheidung

einblenden:

Projektinformation

einblenden:

Quelle 1

einblenden:
ausblenden:
Titel: Thin Solid Films
  Kurztitel : Thin Solid Films
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Lausanne, Switzerland, etc. : Elsevier
Seiten: - Band / Heft: 516 (2-4) Artikelnummer: - Start- / Endseite: 369 - 373 Identifikator: ISSN: 0040-6090
CoNE: https://pure.mpg.de/cone/journals/resource/954925449792