English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction

Maaß, R., Van Petegem, S. V., Grolimund, D., Van Swygenhoven, H., Kiener, D., & Dehm, G. (2008). Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction. Applied Physics Letters, 92(7): 071905. doi:10.1063/1.2884688.

Item is

Basic

show hide
Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-51F1-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-51F2-F
Genre: Journal Article

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Maaß, Robert1, Author              
Van Petegem, Steven V.1, Author              
Grolimund, Daniel1, Author              
Van Swygenhoven, Helena2, Author              
Kiener, Daniel3, Author              
Dehm, Gerhard3, Author              
Affiliations:
1Paul Scherrer Institute, Villigen CH-5232, Switzerland, ou_persistent22              
2Paul Scherrer Institute, Villigen CH-5232, Switzerlan, ou_persistent22              
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

Content

show
hide
Free keywords: -
 Abstract: In situ microdiffraction experiments were conducted on focused ion beam machined single crystal Cu pillars oriented for double slip. During deformation, the crystal undergoes lattice rotation on both the primary and critical slip system. In spite of the initial homogeneous microstructure of the Cu pillar, rotation sets in already at yield and is more important at the top of the pillar than at the bottom, demonstrating the inhomogeneous stress state during a microcompression experiment. The rotation results are confirmed by electron backscatter diffraction measurements.

Details

show
hide
Language(s): eng - English
 Dates: 2008
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1063/1.2884688
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Physics Letters
  Abbreviation : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Melville, NY : American Institute of Physics
Pages: - Volume / Issue: 92 (7) Sequence Number: 071905 Start / End Page: - Identifier: Other: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223