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Abstract:
The spatial resolution of the transmission electron microscope makes it an ideal environment in which to continuously track the real-time response of a system to an external stimulus and to discover and quantify the rate-limiting fundamental microscopic processes and mechanisms governing the macroscopic properties. Advances in instrumentation, stage design, recording media, computational power, and image manipulation software are providing new opportunities for not only observing the microscopic mechanisms but also measuring concurrently the macroscopic response. In this article, the capability of this technique as applied to mechanical properties of materials is highlighted.
