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  Interface structure of epitaxial (111) VN films on (111) MgO substrates

Lazar, P., Rashkova, B., Redinger, J., Podloucky, R., Mitterer, C., Scheu, C., et al. (2008). Interface structure of epitaxial (111) VN films on (111) MgO substrates. Thin Solid Films, 517(3), 1177-1181. doi:10.1016/j.tsf.2008.06.006.

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Lazar, Petr1, Autor           
Rashkova, Boryana2, 3, Autor           
Redinger, Josef1, Autor           
Podloucky, Raimund4, Autor           
Mitterer, Christian5, Autor           
Scheu, Christina6, Autor           
Dehm, Gerhard2, 3, Autor           
Affiliations:
1Institute of Applied Physics, Vienna University of Technology, Vienna, Austria, ou_persistent22              
2Erich-Schmid-Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, 8700 Leoben, Austria, ou_persistent22              
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
4Department of Physical Chemistry, Vienna University, Vienna, Austria, ou_persistent22              
5Department of Physical Metallurgy and Materials Testing, Christian-Doppler Laboratory for Advanced Coatings, University of Leoben, Austria, ou_persistent22              
6Department Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Str. 18, 8700 Leoben, Austria, ou_persistent22              

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 Zusammenfassung: Vanadium nitride VN was grown epitaxially on (111) MgO by reactive magnetron sputtering. The substrate preparation and deposition conditions cause an interface roughness of 2–3 nm. The lattice mismatch of cube-on-cube orientation relationship between (111) VN and (111) MgO is relaxed by misfit dislocations. Ab-initio simulations were employed to calculate the lowest energy configuration of the coherent parts of the interface. This is accomplished by an O termination of the MgO and V termination of VN at the interface.

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Sprache(n): eng - English
 Datum: 2008-06-092008-12-01
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1016/j.tsf.2008.06.006
 Art des Abschluß: -

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Titel: Thin Solid Films
  Kurztitel : Thin Solid Films
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Lausanne, Switzerland, etc. : Elsevier
Seiten: - Band / Heft: 517 (3) Artikelnummer: - Start- / Endseite: 1177 - 1181 Identifikator: ISSN: 0040-6090
CoNE: https://pure.mpg.de/cone/journals/resource/954925449792