In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the 
nano-scale

Kečkéš, Jozef; Eiper, Ernst; Martinschitz, Klaus J.; Boesecke, Peter; Gindl, Wolfgang; Dehm, Gerhard

doi:10.1002/adem.200600156

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In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

Kečkéš, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W., & Dehm, G. (2006). In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials, 8(11), 1084-1088. doi:10.1002/adem.200600156.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-570A-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-570B-9

Genre: Journal Article

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Creators:
Kečkéš, Jozef¹, Author
Eiper, Ernst², Author
Martinschitz, Klaus J.³, Author
Boesecke, Peter⁴, Author
Gindl, Wolfgang⁵, Author
Dehm, Gerhard¹, Author

Affiliations:
1Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
2Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22
3Erich-Schmid-Institut für Materialwissenschaft, Österreichische Akademie der Wissenschaften, Montanuniversität Leoben, Jahnstrasse 12, A-8700 Leoben, Austria, ou_persistent22
46 rue Jules Horowitz, F-38043 Grenoble, France, ou_persistent22
5Institut für Holzforschung, Universität für Bodenkultur, Peter Jordan Strasse 82, A-1190 Wien, Austria, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2006-11

Publication Status: Issued

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Identifiers: DOI: 10.1002/adem.200600156

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Title: Advanced Engineering Materials

Abbreviation : Adv. Eng. Mater.

Source Genre: Journal

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Publ. Info: Weinheim : WILEY-VCH Verlag

Pages: - Volume / Issue: 8 (11) Sequence Number: - Start / End Page: 1084 - 1088 Identifier: ISSN: 1438-1656
CoNE: https://pure.mpg.de/cone/journals/resource/958634688014