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  In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale

Kečkéš, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W., & Dehm, G. (2006). In situ X-ray Diffraction as a tool to probe mechanical phenomena down to the nano-scale. Advanced Engineering Materials, 8(11), 1084-1088. doi:10.1002/adem.200600156.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-570A-B Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-570B-9
Genre: Journal Article

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 Creators:
Kečkéš, Jozef1, Author              
Eiper, Ernst2, Author              
Martinschitz, Klaus J.3, Author              
Boesecke, Peter4, Author              
Gindl, Wolfgang5, Author              
Dehm, Gerhard1, Author              
Affiliations:
1Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Leoben, Austria, ou_persistent22              
3Erich-Schmid-Institut für Materialwissenschaft, Österreichische Akademie der Wissenschaften, Montanuniversität Leoben, Jahnstrasse 12, A-8700 Leoben, Austria, ou_persistent22              
46 rue Jules Horowitz, F-38043 Grenoble, France, ou_persistent22              
5Institut für Holzforschung, Universität für Bodenkultur, Peter Jordan Strasse 82, A-1190 Wien, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2006-11
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1002/adem.200600156
 Degree: -

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Title: Advanced Engineering Materials
  Abbreviation : Adv. Eng. Mater.
Source Genre: Journal
 Creator(s):
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Publ. Info: Weinheim : WILEY-VCH Verlag
Pages: - Volume / Issue: 8 (11) Sequence Number: - Start / End Page: 1084 - 1088 Identifier: ISSN: 1438-1656
CoNE: /journals/resource/958634688014