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  Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D., & Dehm, G. (2010). Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM. Thin Solid Films, 519(5), 1662-1667. doi:10.1016/j.tsf.2010.09.017.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-471D-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0024-471E-F
Genre: Journal Article

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 Creators:
Cazottes, Sophie1, Author              
Zhang, Zaoli1, Author              
Daniel, Rostislav2, Author              
Chawla, Jasmeet S.3, Author              
Gall, Daniel4, Author              
Dehm, Gerhard1, 5, Author              
Affiliations:
1Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
2Christian-Doppler Laboratory for Advanced Coatings, Department of Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Austria, ou_persistent22              
3Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA, ou_persistent22              
4Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY, USA, ou_persistent22              
5Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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 Abstract: Epitaxial Cu(001) layers were deposited on MgO(001) substrates by magnetron sputtering and the atomic structure of the Cu–MgO interface was characterized by spherical aberration (CS)-corrected high-resolution transmission electron microscopy (HRTEM). The interface structure and the misfit dislocation network were determined by imaging in both the b100N and b110N directions. The dislocation network was found to lie along the b100N directions with a Burgers vector of ½ aCu b100N deduced from HRTEM images and geometrical phase analysis. The dislocations do not fully accommodate the lattice mismatch, yielding residual stress at the interface and an elongation of the Cu lattice along the [001] direction.

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Language(s): eng - English
 Dates: 2010-09-162010-12-30
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: DOI: 10.1016/j.tsf.2010.09.017
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Title: Thin Solid Films
  Abbreviation : Thin Solid Films
Source Genre: Journal
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Publ. Info: Lausanne, Switzerland, etc. : Elsevier
Pages: - Volume / Issue: 519 (5) Sequence Number: - Start / End Page: 1662 - 1667 Identifier: ISSN: 0040-6090
CoNE: https://pure.mpg.de/cone/journals/resource/954925449792