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  Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale

Motz, C., Kiener, D., Kirchlechner, C., Grosinger, W., Pippan, R., & Dehm, G. (2011). Advances in in-situ testing in scanning electron microscopes: probing mechanical properties at the nano/micro-scale. In 10th Multinational Congress on Microscopy (MCM 2011) (pp. 57-58).

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-23C9-0 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-2457-8
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 Creators:
Motz, C.1, Author              
Kiener, D.1, Author              
Kirchlechner, C.1, Author              
Grosinger, W.1, Author              
Pippan, R.1, Author              
Dehm, G.1, Author              
Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              

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 Dates: 2011-09-09
 Publication Status: Published in print
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Title: 10th Multinational Congress on Microscopy (MCM 2011)
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Title: 10th Multinational Congress on Microscopy (MCM 2011)
Source Genre: Proceedings
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 57 - 58 Identifier: -