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  Expected and unexpected plastic behavior at the micron scale: An in situ µLaue tensile study

Kirchlechner, C., Imrich, P. J., Grosinger, W., Kapp, M. W., Kečkéš, J., Micha, J.-S., et al. (2012). Expected and unexpected plastic behavior at the micron scale: An in situ µLaue tensile study. Acta Materialia, 60(3), 1252-1258.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-203F-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-001A-2041-9
Genre: Other
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 Creators:
Kirchlechner, C.1, 2, Author              
Imrich, P. J.2, Author              
Grosinger, W.2, Author              
Kapp, M. W.2, Author              
Kečkéš, J.1, Author              
Micha, J.-S.3, 4, Author              
Ulrich, O.3, 4, Author              
Thomas, O.5, 6, Author              
Labat, S.5, 6, Author              
Motz, C.2, Author              
Dehm, G.1, 2, Author              
Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
3CEA-Grenoble, Institut Nanosciences et Cryogénie, Grenoble, France, ou_persistent22              
4CRG-IF BM32, ESRF, Grenoble, France, ou_persistent22              
5Aix-Marseille Université, IM2NP, Campus de Saint-Jérôme, Marseille, France, ou_persistent22              
6CNRS, IM2NP (UMR 6242), Campus de Saint-Jérôme, Marseille, France, ou_persistent22              

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 Abstract: The study of mechanical properties in micron- and submicron-sized metal crystals raises fundamental questions about the influence of size on different aspects of plasticity. In situ characterization of the microstructure evolution during loading is necessary to understand the physics underlying crystal deformation. In situ µLaue diffraction is able to provide unique statistical information on the evolution of type and density of stored dislocations. Here we show macroscopically expected and unexpected plastic behavior at low strains, observed during in situ µLaue tensile tests on micron-sized, single slip oriented Cu samples. Regardless of the initial behavior, a steady state is reached which qualifies a technical yield criterion at the micron scale.

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Language(s): eng - English
 Dates: 2012-02-03
 Publication Status: Published in print
 Pages: -
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 Rev. Method: -
 Identifiers: DOI: 10.1016/j.actamat.2011.10.058
 Degree: -

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Title: Acta Materialia
Source Genre: Journal
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Publ. Info: Tarrytown, NY : Pergamon
Pages: - Volume / Issue: 60 (3) Sequence Number: - Start / End Page: 1252 - 1258 Identifier: ISSN: 1359-6454
CoNE: /journals/resource/954928603100