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Abstract:
The study of mechanical properties in micron- and submicron-sized metal crystals raises fundamental questions about the influence of size on different aspects of plasticity. In situ characterization of the microstructure evolution during loading is necessary to understand
the physics underlying crystal deformation. In situ µLaue diffraction is able to provide unique statistical information on the evolution of type and density of stored dislocations. Here we show macroscopically expected and unexpected plastic behavior at low strains, observed
during in situ µLaue tensile tests on micron-sized, single slip oriented Cu samples. Regardless of the initial behavior, a steady state is reached which qualifies a technical yield criterion at the micron scale.
